BeNTO

BeNTO: Nonlinear and dynamic micromagnetic Behavior modeling and characterization for Non-Destructive Testing techniques OptimizationAxes: Materials & Structure Design, EnergyLeaders: Tetsuya UCHIMOTO (ELyTMaX/IFS, TU) & Gaël SEBALD (ELyTMaX, UdL, TU, CNRS)Participants: Toshiyuki TAKAGI (ELyTMaX/IFS, TU), Benjamin DUCHARNE (LGEF, INSA), Takanori MATSUMOTO (PhD student, IFS, TU)Double degree PhD student:Bhaawan GUPTA (ELyTMaX, UdL, TU, CNRS, IFS, TU)In the framework of Non-Destructive Testing of metallic parts used in the field of electrical power plants or in transportation, a fine modeling of tested materials is developed, including particular frequency dependencies of the signals and ferromagnetic behavior. The collaboration focuses on the modeling and testing of innovative electromagnetic Non-Destructive Testing (NDT) techniques, based on micromagnetic properties of tested materials. Both the modelling of the materials itself (including magnetic major and minor hysteresis loops and their frequency dependence), as well as the modelling of the NDT techniques (such as Barkhausen noise and Magnetic Incremental Permeability) are investigated in order to go further in the sensitivity of the techniques and their ability to differentiate different kind of defects or structural material degradations, in addition to also finding a co-relation between mechanical and magnetic properties of the materials. The project involves noteworthy a double PhD student between INSA-Lyon and Tohoku University, and a PhD student from Tohoku University.Articles in peer-reviewed international journals

1. B. Ducharne, B. Gupta, Y. Hebrard, J.B. Coudert, IEEE Transactions on Magnetics Vol. 54(11) (2018) 6202606, Proceedings of INTERMAG 2018, April 23-26, 2018 doi: 10.1109/TMAG.2018.2833419
2. B. Zhang, B. Gupta, B. Ducharne, G. Sebald, T. Uchimoto, IEEE Transactions on Magnetics Vol. 54(11) (2018) 7301605, Proceedings of INTERMAG 2018, April 23-26, 2018, Singapore doi: 10.1109/TMAG.2018.2832242
3. B. Gupta, B. Ducharne, G. Sebald, T. Uchimoto, IEEE Transactions on Magnetics Vol. 54(3) (2017) 6200204, Proceedings of Compumag 2017, Daejon, Korea doi: 10.1109/TMAG.2017.2773517
4. B. Zhang, B. Gupta, B. Ducharne, G. Sebald, T. Uchimoto, IEEE Transactions on Magnetics Vol. 54(3)(2017) 6100204 Proceedings of Compumag 2017, Daejon, Korea doi: 10.1109/TMAG.2017.2759421